Title :
In situ measurement of misalignment errors in free-space optical interconnects
Author :
Boisset, G.C. ; Rolston, D.R. ; Robertson, B. ; Liu, Y.S. ; Iyer, R. ; Kabal, D. ; Plant, D.V.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
5/1/1998 12:00:00 AM
Abstract :
A nonobtrusive technique for measuring misalignment errors in multistage free-space optical interconnects is proposed. The technique makes use of dedicated microoptics to relay higher order dedicated alignment beams generated by an optical power supply onto alignment detectors located on the periphery of a smart pixel chip. An implementation of this technique for measuring lateral (x-y) misalignment error in a multistage optical backplane demonstrator is then presented. Performance parameters are analyzed and future directions such as photonic extensions to electronic boundary scan standards are suggested
Keywords :
integrated optoelectronics; measurement errors; optical computing; optical interconnections; photodetectors; smart pixels; alignment detectors; dedicated microoptics; electronic boundary scan standards; free-space optical interconnects; higher order dedicated alignment beams; in situ measurement; lateral x-y misalignment error; misalignment error measurement; misalignment errors; multistage optical backplane; nonobtrusive technique; optical power supply; photonic extensions; smart pixel chip; Backplanes; Integrated circuit interconnections; Optical arrays; Optical beams; Optical imaging; Optical interconnections; Optical modulation; Optical receivers; Power generation; Semiconductor device measurement;
Journal_Title :
Lightwave Technology, Journal of
