DocumentCode :
1366534
Title :
ZnO-Based Fairly Pure Ultraviolet Light-Emitting Diodes With a Low Operation Voltage
Author :
Huang, Huihui ; Fang, Guojia ; Mo, Xiaoming ; Long, Hao ; Yuan, Longyan ; Dong, Binzhong ; Meng, Xianquan ; Zhao, Xingzhong
Author_Institution :
Dept. of Electron. Sci. & Technol., Wuhan Univ., Wuhan, China
Volume :
30
Issue :
10
fYear :
2009
Firstpage :
1063
Lastpage :
1065
Abstract :
A ZnO-based metal-insulator (HfO2) -semiconductor diode was synthesized on a commercially available n+-GaN/sapphire substrate using a radio-frequency magnetron sputtering system. Electroluminescence measurements revealed that the diode exhibited fairly pure ultraviolet (UV) emission peaking at ~ 370 nm with a line width of less than 8 nm. By choosing a proper thickness of the insulator HfO2 layer, the threshold voltage of the emission could be reduced to 2 V, demonstrating that this ZnO-based fairly pure UV light-emitting diode can be driven by two ordinary dry batteries. The reason for low threshold voltage is proposed in terms of the n+-GaN/sapphire substrate and the high-k insulator HfO2 layer.
Keywords :
MIS devices; dielectric materials; electroluminescence; gallium compounds; light emitting diodes; sapphire; semiconductor diodes; substrates; wide band gap semiconductors; zinc compounds; GaN; HfO2; ZnO; electroluminescence measurements; fairly pure ultraviolet light-emitting diodes; gallium nitride-sapphire substrate; high-k insulator hafnium oxide layer; metal-insulator; ordinary dry batteries; radio-frequency magnetron sputtering system; semiconductor diode; ultraviolet emission; $hbox{HfO}_{2}$ ; Electroluminescence (EL); ZnO; light-emitting diode (LED); metal–insulator–semiconductor (MIS); ultraviolet (UV);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2009.2028904
Filename :
5235112
Link To Document :
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