• DocumentCode
    1366590
  • Title

    Using a carbon beam as a probe to extract the thickness of sensitive volumes

  • Author

    Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Guibert, L. ; Barak, J. ; Chabot, M.

  • Author_Institution
    Office Nat. d´´Etudes et de Recherches Aerospatiales, ONERA-CERT, Toulouse, France
  • Volume
    47
  • Issue
    3
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    551
  • Lastpage
    558
  • Abstract
    The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume (Sv) of thickness d. We have developed a new extraction method in order to get d from experimental data. It is based upon the deconvolution of the heavy ion upset cross section function σseu(r) with LET(r) (r is the range of the incident ion)
  • Keywords
    deconvolution; proton effects; semiconductor device measurement; deconvolution; extraction method; heavy ion upset cross section function; incident ion range; proton SEU predictions; secondaries paths; sensitive volumes; upset rate calculation; Charge measurement; Current measurement; Data mining; Deconvolution; Energy measurement; Ion beams; Predictive models; Probes; Protons; Volume measurement;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.856479
  • Filename
    856479
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1366590