Title :
Using a carbon beam as a probe to extract the thickness of sensitive volumes
Author :
Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Guibert, L. ; Barak, J. ; Chabot, M.
Author_Institution :
Office Nat. d´´Etudes et de Recherches Aerospatiales, ONERA-CERT, Toulouse, France
fDate :
6/1/2000 12:00:00 AM
Abstract :
The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume (Sv) of thickness d. We have developed a new extraction method in order to get d from experimental data. It is based upon the deconvolution of the heavy ion upset cross section function σseu(r) with LET(r) (r is the range of the incident ion)
Keywords :
deconvolution; proton effects; semiconductor device measurement; deconvolution; extraction method; heavy ion upset cross section function; incident ion range; proton SEU predictions; secondaries paths; sensitive volumes; upset rate calculation; Charge measurement; Current measurement; Data mining; Deconvolution; Energy measurement; Ion beams; Predictive models; Probes; Protons; Volume measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
