Title :
Breakthrough in pulse-shape based particle identification with silicon detectors
Author :
Mutterer, M. ; Trzaska, W.H. ; Tyurin, G.P. ; Evsenin, A.V. ; von Kalben, J. ; Kemmer, J. ; Kapusta, M. ; Lyapin, V.G. ; Khlebnikov, S.V.
Author_Institution :
Inst. of Nucl. Phys., Tech. Hochschule Darmstadt, Germany
fDate :
6/1/2000 12:00:00 AM
Abstract :
Identification of charged particles is an important method in nuclear spectroscopy. We have achieved a major breakthrough that makes pulse-shape discrimination (PSD) method with a single solid-state detector comparable to and sometimes better than traditional telescope technique. By using rear-side injection in over-biased surface barrier n-type Si detectors made from homogeneously doped n-TD silicon, and extracting the pulse-shape information already at the preamplifier level we have reached improved Z and even A discrimination over a wide dynamic range. Previously good separation with PSD technique required major degradation of time resolution and inferior energy resolution. Currently we have pushed down the dynamical time range to below 35 ns and reached time resolution of about 200 ps fwhm while maintaining good energy resolution characteristic of silicon detectors. The lowest energy threshold for Z separation of intermediate mass fragments (IMF) achieved with a 250 μm thick detector is equivalent to a range of about 20 μm in silicon. For IMFs with ranges higher than 80 μm of silicon we got full isotope separation. Details of this study are presented, and the application of our method in recent nuclear physics experiments is briefly discussed
Keywords :
nuclear electronics; preamplifiers; silicon radiation detectors; Si; dynamical time range; energy resolution; homogeneously doped n-TD silicon; intermediate mass fragments; isotope separation; over-biased surface barrier n-type Si detectors; preamplifier level; pulse-shape based particle identification; pulse-shape discrimination method; pulse-shape information; rear-side injection; silicon detectors; time resolution; Data mining; Degradation; Detectors; Dynamic range; Energy resolution; Preamplifiers; Silicon; Solid state circuits; Spectroscopy; Telescopes;
Journal_Title :
Nuclear Science, IEEE Transactions on