Degradation of ZnO based surge arresters under field conditions

Author

Plata, A.M. ; Ponce, M.A. ; Rios, J.M. ; De la Rosa, F. ; Castano, V.M.

Author_Institution

Inst. de Investigaciones Electricas, Cuernavaca, Mexico

Volume

143

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

291

Lastpage

297

Abstract

An experimental study of the degradation of ZnO based lightning arresters is presented. The study included X-ray, SEM and electrical characterisation of commercial samples, first as received and then after they have been subjected to either an artificial degradation or field degradation, The results show that changes in the specific local composition are clearly associated with the degraded samples, indicating the possible mechanisms for this phenomenon, in terms of segregation of some species during the degradation and also in terms of some of the particular microstructures observed in the laboratory and in the field degraded specimens, which indicates the pertinence of field experiments for exploring the span of the working life of these devices

Keywords

II-VI semiconductors; X-ray diffraction; arresters; crystal microstructure; environmental degradation; lightning protection; scanning electron microscopy; segregation; thermal shock; varistors; zinc compounds; II-VI semiconductor; SEM characterisation; X-ray characterisation; ZnO; degradation; electrical characterisation; field conditions; lightning arresters; microstructures; segregation; specific local composition changes; surge arresters; thermal shock; varistors; working life;

fLanguage

English

Journal_Title

Science, Measurement and Technology, IEE Proceedings -

Publisher

iet

ISSN

1350-2344

Type

jour

DOI

10.1049/ip-smt:19960484

Filename

536429