• DocumentCode
    1367619
  • Title

    Efficient handling of operating range and manufacturing line variations in analog cell synthesis

  • Author

    Mukherjee, Tamal ; Carley, L. Richard ; Rutenbar, Rob A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    19
  • Issue
    8
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    825
  • Lastpage
    839
  • Abstract
    We describe a synthesis system that takes operating range constraints and inter and intracircuit parametric manufacturing variations into account while designing a sized and biased analog circuit. Previous approaches to computer-aided design for analog circuit synthesis have concentrated on nominal analog circuit design, and subsequent optimization of these circuits for statistical fluctuations and operating point ranges. Our approach simultaneously synthesizes and optimizes for operating and manufacturing variations by mapping the circuit design problem into an infinite programming problem and solving it using an annealing within annealing formulation. We present circuits designed by this integrated synthesis system, and show that they indeed meet their operating range and parametric manufacturing constraints. And finally, we show that our consideration of variations during the initial optimization-based circuit synthesis leads to better starting points for post-synthesis yield optimization than a classical nominal synthesis approach
  • Keywords
    circuit CAD; circuit optimisation; integrated circuit design; integrated circuit yield; mixed analogue-digital integrated circuits; analog cell synthesis; analog circuit synthesis; computer-aided design; manufacturing line variations; operating range; optimization-based circuit synthesis; parametric manufacturing constraints; post-synthesis yield optimization; Analog circuits; Annealing; Circuit synthesis; Design automation; Design optimization; Fluctuations; Integrated circuit manufacture; Integrated circuit synthesis; Manufacturing; Simultaneous localization and mapping;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.856971
  • Filename
    856971