Cellular automata-based test pattern generators with phase shifters

Author

Mrugalski, Grzegorz ; Rajski, Janusz ; Tyszer, Jerzy

Author_Institution

Inst. of Electron. & Telecommun., Poznan Univ. of Technol., Poznan, Poland

Volume

19

Issue

8

fYear

2000

fDate

8/1/2000 12:00:00 AM

Firstpage

878

Lastpage

893

Abstract

The paper presents a novel, comprehensive and systematic methodology, which can be used to automate synthesis of cellular automata-based test pattern generators with phase shifters. First, a very fast and simple simulation framework is proposed to either verify or generate maximum-length linear finite state machines such as cellular automata or linear feedback shift registers. Subsequently, a new framework is presented for efficient selection of phase shifters that satisfy criteria of channel separation and circuit complexity. As shown in the paper, it is possible to synthesize, in a time-efficient manner, very large cellular automata and their corresponding fast phase shifters for built-in self-test applications with guaranteed structural and functional properties

Keywords

automatic test pattern generation; built-in self test; cellular automata; finite state machines; integrated circuit testing; logic testing; phase shifters; shift registers; built-in self-test applications; cellular automata-based test pattern generators; channel separation; circuit complexity; functional properties; linear feedback shift registers; maximum-length linear finite state machines; phase shifters; simulation framework; structural properties; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Linear feedback shift registers; Phase shifters; System testing; Test pattern generators;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.856975

Filename

856975