• DocumentCode
    1367936
  • Title

    Consistency checking and optimization of macromodels

  • Author

    Ju, Yun-Cheng ; Rao, Vasant B. ; Saleh, Resve A.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    10
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    957
  • Lastpage
    967
  • Abstract
    A systematic methodology for automatic consistency checking and optimization of parameterized macromodels is described. An overview of the entire macromodel verification system. iMAVERICK, is provided. An efficient stochastic algorithm to optimize the parameters of a given macromodel is described, and a number of characteristics of the algorithm are examined. A heuristic measure of the likelihood that a cost evaluation will provide useful information or a better solution that is used in the algorithm is based on the information accumulated from the previous cost evaluations. This heuristic measure is used to reject poor sample points without sacrificing the quality of solutions. A waveform comparison technique for evaluating the performance of the proposed configuration in the optimization process is described. It is sensitive to phase errors between waveforms and has the capability of filtering out glitches and high-frequency noise. Several examples of macromodel optimization using the iMAVERICK system are presented
  • Keywords
    circuit CAD; circuit analysis computing; optimisation; stochastic processes; automatic consistency checking; cost evaluation; heuristic measure; iMAVERICK; macromodel verification system; macromodels; optimization; phase errors; stochastic algorithm; waveform comparison technique; Circuit simulation; Computational modeling; Costs; Design automation; Design optimization; Filters; Phase locked loops; Stochastic processes; Switching circuits; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.85733
  • Filename
    85733