DocumentCode :
1367942
Title :
The fault dropping problem in concurrent event-driven simulation
Author :
Gai, Silvano ; Montessoro, Pier Luca
Author_Institution :
Politecnico di Torino, Italy
Volume :
10
Issue :
8
fYear :
1991
fDate :
8/1/1991 12:00:00 AM
Firstpage :
968
Lastpage :
971
Abstract :
The dynamic removal of faults before the end of the test pattern is reached, called fault dropping (FD), is considered. The conventional technique, called synchronous FD, is analyzed. An asynchronous FD method is introduced and its performance compared with that of the conventional method. It is based on the concept of removing descriptors while the simulation procedures access the data structure. This technique guarantees the maximum efficiency in reducing the computational effort. Experimental results show that it can considerably speed up simulation, particularly for large networks. It is shown that a mixed synchronous/asynchronous approach can optimize the total amount of memory needed
Keywords :
circuit analysis computing; digital simulation; fault location; asynchronous FD method; concurrent event-driven simulation; data structure accessing; dynamic fault removal; fault dropping; large networks; mixed synchronous/asynchronous approach; synchronous FD; test pattern; Benchmark testing; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Discrete event simulation; Electrical fault detection; Fault detection;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.85734
Filename :
85734
Link To Document :
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