• DocumentCode
    1368139
  • Title

    The intertool profile interchange format: a technology CAD environment approach [semiconductor technology]

  • Author

    Wong, Alexander S. ; Neureuther, Andrew R.

  • Author_Institution
    Electron. Res. Lab., California Univ., Berkeley, CA, USA
  • Volume
    10
  • Issue
    9
  • fYear
    1991
  • fDate
    9/1/1991 12:00:00 AM
  • Firstpage
    1157
  • Lastpage
    1162
  • Abstract
    The binary profile interchange format (BPIF) defines a set of objects and a library of functions which describe an intertool version of the PIF, a representation for semiconductor wafer information. The BPIF toolkit function library enables technology computer-aided design (TCAD) tools, such as process and device simulators, to access PIF data through a common interface, thus facilitating tool integration and encouraging utility sharing. This approach defines a toolkit that is easy to use, and which meets the tool integration and performance needs within a TCAD environment. An experimental BPIF toolkit, based on the C language and the OCT data manager is described in detail. Examples are shown of how TCAD tools may use the toolkit to `randomly´ access wafer data, such as grids and geometries, within a graph of PIF objects. A BPIF package supporting the use of the intertool PIF within the PROSE TCAD environment, which includes a link to the PIF intersite file format, is then presented
  • Keywords
    CAD; digital simulation; electronic data interchange; electronic engineering computing; integrated circuit technology; object-oriented databases; semiconductor technology; BPIF toolkit function; C language; OCT data manager; PIF intersite file format; PROSE; binary profile interchange format; common interface; computer-aided design; intertool version; semiconductor wafer information; technology CAD environment; technology CAD tools; tool integration; utility sharing; Circuit simulation; Data structures; Geometry; Libraries; Packaging; Programming profession; Prototypes; Solid modeling; Standardization; Standards development;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.85762
  • Filename
    85762