• DocumentCode
    1368513
  • Title

    Experience with the merry-go-round test

  • Author

    Gubanski, Stanislaw Michal

  • Author_Institution
    Inst. of Electr. Eng. Fundamentals, Tech. Univ. of Wroclaw, Poland
  • Volume
    25
  • Issue
    2
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    331
  • Lastpage
    340
  • Abstract
    Studies of the merry-go-round test (MGR), using a newly built apparatus, and the influence of the test procedure on the performance of different HV polymeric outdoor insulation housing materials are presented. In the test, the surface leakage currents, mass and wettability changes of the studied samples were monitored. The materials investigated were bisphenolic and cycloaliphatic epoxies, HTV and RTV silicone rubbers, and EPDM rubbers. Results show that epoxies containing a silane-treated filler perform very well in the test. The performance of the silicone rubbers, except for preservation of their hydrophobic properties, was comparable to that of the EPDM rubbers. This is contradictory to the materials´ field performance and indicates that there are still problems with interpretation of the MGR test results and their correlation with actual service experience
  • Keywords
    environmental testing; insulation testing; materials testing; organic insulating materials; polymers; EPDM rubbers; HTV silicone rubbers; HV polymeric outdoor insulation housing materials; RTV silicone rubbers; actual service experience; bisphenolic epoxies; cycloaliphatic epoxies; epoxies with silane treated filler; field performance; hydrophobic properties; mass changes; mass loss; merry-go-round test; polymeric insulation; surface leakage currents changes; test procedure; test results interpretation; wettability changes; Conducting materials; Electrodes; Epoxy resins; Insulation testing; Leakage current; Materials testing; Plastic insulation; Polymers; Rubber; Wheels;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.52380
  • Filename
    52380