DocumentCode :
1368527
Title :
Multiresolution image classification by hierarchical modeling with two-dimensional hidden Markov models
Author :
Li, Jia ; Gray, Robert M. ; Olshen, Richard A.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
Volume :
46
Issue :
5
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
1826
Lastpage :
1841
Abstract :
This paper treats a multiresolution hidden Markov model for classifying images. Each image is represented by feature vectors at several resolutions, which are statistically dependent as modeled by the underlying state process, a multiscale Markov mesh. Unknowns in the model are estimated by maximum likelihood, in particular by employing the expectation-maximization algorithm. An image is classified by finding the optimal set of states with maximum a posteriori probability. States are then mapped into classes. The multiresolution model enables multiscale information about context to be incorporated into classification. Suboptimal algorithms based on the model provide progressive classification that is much faster than the algorithm based on single-resolution hidden Markov models
Keywords :
feature extraction; hidden Markov models; image classification; image representation; image resolution; maximum likelihood estimation; optimisation; probability; 2D hidden Markov models; computational complexity; expectation-maximization algorithm; feature vectors; hierarchical modeling; image representation; maximum a posteriori probability; maximum likelihood estimation; multiresolution HMM; multiresolution image classification; multiresolution model; multiscale Markov mesh; multiscale information; progressive classification; state process; suboptimal algorithms; Classification algorithms; Context modeling; Expectation-maximization algorithms; Gaussian distribution; Hidden Markov models; Image classification; Image resolution; Image segmentation; Maximum likelihood estimation; Probability;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/18.857794
Filename :
857794
Link To Document :
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