Title :
Model-based classification of radar images
Author :
Chiang, Hung-Chih ; Moses, Randolph L. ; Potter, Lee C.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
A Bayesian approach is presented for model-based classification of images with application to synthetic-aperture radar. Posterior probabilities are computed for candidate hypotheses using physical features estimated from sensor data along with features predicted from these hypotheses. The likelihood scoring allows propagation of uncertainty arising in both the sensor data and object models. The Bayesian classification, including the determination of a correspondence between unordered random features, is shown to be tractable, yielding a classification algorithm, a method for estimating error rates, and a tool for evaluating the performance sensitivity. The radar image features used for classification are point locations with an associated vector of physical attributes; the attributed features are adopted from a parametric model of high-frequency radar scattering. With the emergence of wideband sensor technology, these physical features expand interpretation of radar imagery to access the frequency- and aspect-dependent scattering information carried in the image phase
Keywords :
Bayes methods; electromagnetic wave scattering; feature extraction; image classification; probability; radar imaging; synthetic aperture radar; Bayesian approach; Bayesian classification; SAR; aspect-dependent scattering; classification algorithm; error rates estimation; feature estimation; frequency-dependent scattering; high-frequency radar scattering; image phase; likelihood scoring; model-based classification; object models; parametric model; performance sensitivity; point locations; posterior probabilities; radar image features; radar images; sensor data; synthetic-aperture radar; uncertainty propagation; unordered random features correspondence; wideband sensor technology; Bayesian methods; Classification algorithms; Error analysis; Physics computing; Radar applications; Radar imaging; Radar scattering; Sensor phenomena and characterization; Uncertainty; Yield estimation;
Journal_Title :
Information Theory, IEEE Transactions on