Title :
Nonhermetic plastic packaging of high voltage electronic switches utilizing a low-stress glob coating for 95/5Pb/Sn solder joints of flip-chip bonded multichip module high voltage devices
Author :
Ching Ping Wong ; Segelken, John M. ; Tai, K.L. ; Wong, Ching Ping
Author_Institution :
Sch. of Mater. Sci. & Eng. & Packaging, Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
1/1/1998 12:00:00 AM
Abstract :
AT&T´s number five electronic switching system (ESS) is a state-of-the-art electronic switch that uses solid-state gated-diode-crosspoint (GDX) for fast switching of telephone calls. These GDXs operate at 375 V and require exceptional protection and reliability performance of these packages. Ceramic hermetic packages were used for these type of devices. In order to reduce the cost of these GDXs, a new type of flip-chip bonded structure with 95/5 Pb/Sn solder joints GDXs was developed. These flip-chip GDXs were surface-mounted on a conventional ceramic substrate. An thixotropic silicone gel was used as an underfill and overfill glob-coating to provide the ultrahigh reliability performance of these high voltage devices and a silicone elastomer was used to pot the hybrid surface-mounted GDX multi-chip module structure to further enhance the robustness of its structure. In this paper, the materials such as the flip-chip solder (95/5 Pb/Sn), silicone gel, and elastomer, and their processes such as flip-chip bumping, reflow, cleaning, encapsulation and reliability testing are described for this robust, high performance and low-cost packages
Keywords :
electronic switching systems; flip-chip devices; multichip modules; plastic packaging; soldering; 375 V; Pb-Sn; bumping; cleaning; elastomer; electronic switching system; encapsulation; flip-chip bonded multichip module; high voltage device; hybrid surface-mounted GDX; low-stress glob coating; nonhermetic plastic packaging; protection; reflow; reliability; solder joint; solid-state gated-diode-crosspoint; thixotropic silicone gel; Ceramics; Electronic switching systems; Electronics packaging; Plastic packaging; Robustness; Solid state circuits; Switches; Telephony; Tin; Voltage;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
DOI :
10.1109/3476.670026