DocumentCode
1368597
Title
Application of a simple and efficient source excitation technique to the FDTD analysis of waveguide and microstrip circuits
Author
Zhao, An Ping ; Raisanen, Antti V.
Author_Institution
Fac. of Electr. Eng., Helsinki Univ. of Technol., Espoo, Finland
Volume
44
Issue
9
fYear
1996
fDate
9/1/1996 12:00:00 AM
Firstpage
1535
Lastpage
1539
Abstract
A simple, efficient, and unified source excitation scheme for the finite-difference time domain (FDTD) analysis of both waveguides and microstrip circuits is developed and validated. In this scheme, by moving the source plane several cells inside the terminal plane and adding the excitation wave as an extra term in the FDTD equation, the interaction between the excitation and reflected waves are totally separated in time domain. Hence, for both waveguide and microstrip discontinuities, absorbing boundary conditions can be applied on the terminal plane directly. In particular, for microstrip circuits, our scheme does not induce any source distortions when a simplified field distribution is used as the excitation. Consequently, the terminal plane can be moved very close to the discontinuity and thus significant computational savings are achieved. In addition, for microstrip systems, the validity and efficiency of the Mei´s simplified field distribution are evaluated and confirmed for the first time
Keywords
circuit CAD; finite difference time-domain analysis; microstrip circuits; microstrip discontinuities; microwave integrated circuits; waveguide discontinuities; FDTD analysis; Mei´s simplified field distribution; absorbing boundary conditions; computational savings; excitation wave; microstrip circuits; microstrip discontinuities; source excitation technique; terminal plane; waveguide discontinuities; waveguides; Boundary conditions; Circuits; Equations; Finite difference methods; Microstrip components; Planar waveguides; Reflection; Steady-state; Time domain analysis; Waveguide discontinuities;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.536601
Filename
536601
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