Title :
Lightwave frequency tracking with a tunable DBR laser
Author_Institution :
NTT Transmission Syst. Lab., Kanagawa, Japan
fDate :
9/1/1991 12:00:00 AM
Abstract :
Described are the construction and noise performance of a lightwave frequency tracking loop, which is indispensable for sub-megahertz frequency-control of tunable laser diodes (LDs). The tracking loop is constructed with a tunable distributed-Bragg-reflector (DBR) LD as a conventional phase-locked loop (PLL), and a wide-dynamic-range digital phase detector is used to overcome the extremely large phase noise of the DBR LD. The white and flicker frequency-noise components of the phase noise in an experimental DBR LD are estimated from measured linewidth Δv and frequency fluctuations σv, respectively, and the increase in the flicker component with tuning is reported. A PLL analysis based on the measured values of Δv=29 MHz and σv=2.4 MHz predicts that the phase error in the tracking loop is mainly caused by the flicker frequency-noise component, not by the white frequency-noise component. A tracking experiment with the DBR LD demonstrates that measured noise performance agrees with theoretical predictions. Guidelines for tracking-loop designs are also described
Keywords :
distributed Bragg reflector lasers; electron device noise; frequency control; laser accessories; laser tuning; optical variables control; phase-locked loops; physical instrumentation control; random noise; semiconductor junction lasers; white noise; construction; flicker frequency-noise components; frequency fluctuations; lightwave frequency tracking; linewidth; noise performance; phase error; phase noise; phase-locked loop; sub-megahertz frequency-control; tunable DBR laser; tunable laser diodes; tuning; white noise; wide-dynamic-range digital phase detector; Distributed Bragg reflectors; Frequency estimation; Frequency measurement; Laser noise; Noise measurement; Phase locked loops; Phase measurement; Phase noise; Tracking loops; Tunable circuits and devices;
Journal_Title :
Lightwave Technology, Journal of