Title :
Capacitors with very low loss: cryogenic vacuum-gap capacitors
Author :
Zimmerman, Neil M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
10/1/1996 12:00:00 AM
Abstract :
We report on measurements of capacitors with about 1 pF of capacitance, which have unmeasurably small leakage at very low frequencies, placing a lower bound of about 1019Ω on the parallel resistance at an effective frequency of 1 mHz. These measurements are made possible by two themes: the use of vacuum-gap capacitors (i.e., no dielectric material, operated in vacuum), and detection of leakage using single electron tunneling (SET) electrometers, which have very high input impedance. We also report on good achieved results in time stability and lack of frequency and voltage dependence
Keywords :
bridge circuits; capacitance measurement; capacitors; characteristics measurement; electrical faults; electrometers; electron device noise; low-temperature techniques; stability; tunnelling; 1 mHz; 1 pF; 10E19 ohm; AC stability; DC stability; cryogenic vacuum-gap capacitors; frequency dependence; input impedance; leakage; parallel resistance; single electron tunneling electrometers; time stability; vacuum-gap capacitors; voltage dependence; Capacitance measurement; Capacitors; Cryogenics; Dielectric materials; Dielectric measurements; Electrical resistance measurement; Electrons; Frequency measurement; Impedance measurement; Leak detection;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on