Title :
Large-area, real-time imaging system for surface acoustic wave devices
Author :
Gualtieri, John G. ; Kosinski, John A.
Author_Institution :
Geo-Centers Inc., Eatontown, NJ, USA
fDate :
10/1/1996 12:00:00 AM
Abstract :
A system for imaging the particle displacement envelope of vibrational (transverse) modes of surface acoustic wave (SAW) devices is described. The modes are being imaged using a schlieren method for visualizing the acoustic power flow with a beam-expanded helium-neon (HeNe) laser. The optical arrangement uses internal reflection from within the quartz substrate to achieve high-efficiency acousto-optic diffraction of the laser light. The use of a CCD camera coupled with a frame grabber and a computer with image calculator software establishes an imaging system for large-area, real-time visualization, recording, accurate measurement, and analysis of vibrational modes of SAW devices. These methods are part of an effort to determine the relationship between acceleration sensitivity and transverse variations in the acoustic-mode shape in SAW resonators. Use of the system in imaging a 98 MHz SAW device is presented as an example
Keywords :
CCD image sensors; acousto-optical effects; computerised instrumentation; image processing; light diffraction; measurement by laser beam; physics computing; real-time systems; surface acoustic wave resonators; vibrational modes; vibrations; 98 MHz; CCD camera; HeNe; SAW resonators; acceleration sensitivity; acoustic power flow; acoustic-mode shape; beam-expanded HeNe laser; frame grabber; high-efficiency acousto-optic diffraction; image calculator software; imaging system; internal reflection; particle displacement envelope; quartz substrate; real-time imaging; real-time visualization; schlieren method; surface acoustic wave devices; transverse variations; vibrational modes; Acoustic imaging; Acoustic waves; Laser modes; Optical imaging; Optical recording; Optical surface waves; Real time systems; Surface acoustic wave devices; Surface acoustic waves; Visualization;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on