• DocumentCode
    1369321
  • Title

    HOPE: an efficient parallel fault simulator for synchronous sequential circuits

  • Author

    Lee, Hyung Ki ; Ha, Dong Sam

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    15
  • Issue
    9
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    1048
  • Lastpage
    1058
  • Abstract
    HOPE is an efficient parallel fault simulator for synchronous sequential circuits that employs the parallel version of the single fault propagation technique. HOPE is based on an earlier fault simulator railed PROOFS, which employs several heuristics to efficiently drop faults and to avoid simulation of many inactive faults. In this paper, we propose three new techniques that substantially speed up parallel fault simulation: (1) reduction of faults simulated in parallel through mapping nonstem faults to stem faults, (2) a new fault injection method called functional fault injection, and (3) a combination of a static fault ordering method and a dynamic fault ordering method. Based on our experiments, our fault simulator, HOPE, which incorporates the proposed techniques, is about 1.6 times faster than PROOFS for 16 benchmark circuits
  • Keywords
    circuit analysis computing; fault diagnosis; logic testing; sequential circuits; HOPE; dynamic fault ordering; functional fault injection; nonstem faults; parallel fault simulator; static fault ordering; stem faults; synchronous sequential circuit; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Design automation; Electrical fault detection; Fault detection; Scholarships; Sequential circuits;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.536711
  • Filename
    536711