DocumentCode
1369376
Title
Demonstration of Intrinsic Tristability in Double-Barrier Resonant Tunneling Diodes With the Wigner Transport Equation
Author
Yoder, P.Douglas ; Grupen, M. ; Smith, R. Kent
Author_Institution
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
57
Issue
12
fYear
2010
Firstpage
3265
Lastpage
3274
Abstract
The operation of double-barrier resonant tunneling diodes (RTDs) is investigated through self-consistent numerical solution of the Wigner transport equation. Prevalent boundary conditions are demonstrated to lead to unphysical boundary layers in electrostatically self-consistent calculations. New boundary conditions based on nonequilibrium statistics are proposed and validated. Unphysical solutions are also associated with the application of the popular Boltzmann collision operator in the limit of high electron density. An original formulation of the collision operator in the relaxation time approximation is proposed leading to proper asymptotic behavior in both limits of the relaxation time. Coupled solutions of the Wigner transport equation and the Poisson equation for an RTD structure reveal current to be a continuous but multivalued function of applied bias and tristability to be an intrinsic property of device operation.
Keywords
Poisson equation; Wigner distribution; carrier relaxation time; resonant tunnelling diodes; semiconductor device models; Poisson equation; Wigner transport equation; double-barrier resonant tunneling diodes; high electron density; intrinsic tristability; nonequilibrium statistics; relaxation time approximation; unphysical boundary layers; Boundary conditions; Numerical analysis; Poisson equations; Resonant tunneling devices; Semiconductor device modeling; Numerical analysis; quantum effect semiconductor devices; resonant tunneling diodes (RTDs); semiconductor device modeling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2081672
Filename
5620965
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