• DocumentCode
    1369376
  • Title

    Demonstration of Intrinsic Tristability in Double-Barrier Resonant Tunneling Diodes With the Wigner Transport Equation

  • Author

    Yoder, P.Douglas ; Grupen, M. ; Smith, R. Kent

  • Author_Institution
    Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    57
  • Issue
    12
  • fYear
    2010
  • Firstpage
    3265
  • Lastpage
    3274
  • Abstract
    The operation of double-barrier resonant tunneling diodes (RTDs) is investigated through self-consistent numerical solution of the Wigner transport equation. Prevalent boundary conditions are demonstrated to lead to unphysical boundary layers in electrostatically self-consistent calculations. New boundary conditions based on nonequilibrium statistics are proposed and validated. Unphysical solutions are also associated with the application of the popular Boltzmann collision operator in the limit of high electron density. An original formulation of the collision operator in the relaxation time approximation is proposed leading to proper asymptotic behavior in both limits of the relaxation time. Coupled solutions of the Wigner transport equation and the Poisson equation for an RTD structure reveal current to be a continuous but multivalued function of applied bias and tristability to be an intrinsic property of device operation.
  • Keywords
    Poisson equation; Wigner distribution; carrier relaxation time; resonant tunnelling diodes; semiconductor device models; Poisson equation; Wigner transport equation; double-barrier resonant tunneling diodes; high electron density; intrinsic tristability; nonequilibrium statistics; relaxation time approximation; unphysical boundary layers; Boundary conditions; Numerical analysis; Poisson equations; Resonant tunneling devices; Semiconductor device modeling; Numerical analysis; quantum effect semiconductor devices; resonant tunneling diodes (RTDs); semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2081672
  • Filename
    5620965