DocumentCode :
1369422
Title :
Accurate measurements over wide parameter ranges
Author :
Kind, D.
Author_Institution :
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
Volume :
3
Issue :
4
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
473
Lastpage :
481
Abstract :
The SI units of physical quantities can be accurately realized and reproduced. The application of macroscopic quantum effects is an option for a highly improved reproduction of units. However, the measurement uncertainty over wide scale ranges easily can become unacceptably high. Proving traceability which is a general demand in establishing quality management systems according to ISO 9000, may then become a very difficult task. This is of particular significance to industrial metrology and research where multiples and submultiples of the respective SI units occur. Typical examples of this in the characterization of electrical insulation are gigaohm, megavolt, micrometer, nanoampere or even picocoulomb. The evaluation and improvement of the measurement accuracy on scales are therefore topical research subjects in metrology
Keywords :
ISO standards; electric variables measurement; measurement standards; units (measurement); ISO 9000; SI units; electrical insulation; industrial research; macroscopic quantum effects; measurement accuracy; metrology; parameter ranges; quality management systems; scales; traceability; Bridge circuits; Capacitance; Capacitors; Circuit testing; Dielectrics and electrical insulation; Electric variables measurement; Measurement standards; Metrology; Quality management; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/94.536725
Filename :
536725
Link To Document :
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