• DocumentCode
    1369447
  • Title

    Size effect and statistical characteristics of dc and pulsed breakdown of liquid helium

  • Author

    Suehiro, J. ; Ohno, K. ; Takahashi, T. ; Miyama, M. ; Hara, M.

  • Author_Institution
    Dept. of Electr. Eng., Kyushu Univ., Fukuoka, Japan
  • Volume
    3
  • Issue
    4
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    507
  • Lastpage
    514
  • Abstract
    Breakdown time lag in liquid helium is measured over a wide range of electrode sizes and pulsed electric field strengths. The breakdown time lag and dc breakdown strength are statistically analyzed by using the Weibull distribution function and weak link theory. It is found that the time lag depends on both electrical stress and the electrode surface area stressed above a critical level. It is supposed that breakdown triggering electrons are generated by field emission phenomena at small protrusion tips on the cathode surface. In higher external electric fields, a less sharper protrusion emits initial electrons with a shorter time lag and may become responsible for liquid breakdown. A theoretical equation is proposed to predict the electrode size and electrical stress dependency of the breakdown time lag, based on Fowler and Nordheim theory. It is shown that the equation is consistent with the Weibull distribution function under multiple stress of electric field and stressing time
  • Keywords
    Weibull distribution; dielectric liquids; electric breakdown; electron field emission; insulating materials; liquid helium; DC breakdown; Fowler Nordheim theory; He; Weibull distribution function; cathode surface; electrical stress; electrode size; electrode surface area; field emission; liquid helium; protrusion tip; pulsed breakdown; statistical characteristics; time lag; triggering electrons; weak link theory; Electric breakdown; Electric variables measurement; Electrodes; Electron emission; Equations; Helium; Pulse measurements; Size measurement; Stress; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.536729
  • Filename
    536729