Title :
The residual ac breakdown voltage of 6.6 kV dry-cured XLPE power cable under wet-accelerated aging tests
Author :
Hashizume, T. ; Shinoda, C. ; Nakamura, K. ; Hotta, M. ; Tani, T.
Author_Institution :
Power Cable R&D, Yazaki Electric Wire Co. Ltd., Numazu, Japan
fDate :
4/1/1998 12:00:00 AM
Abstract :
The residual ac breakdown voltage decreased to about half of the initial breakdown voltage after 3 months of accelerated aging test under immersion. This decrease was found to be caused mainly by a trace amount of moisture existing in the insulation. However, the breakdown voltage did not further decrease with increasing moisture content. In order to clarify the influence of moisture, the state of water existing in the insulation was investigated using FTIR (Fourier transform infrared spectroscopy) and optical microscopy. From these results, it was concluded that the moisture in the amorphous region and/or at the interface next to the crystal region caused the reduction of the ac breakdown voltage
Keywords :
Fourier transform spectroscopy; XLPE insulation; ageing; infrared spectroscopy; insulation testing; life testing; optical microscopy; power cable insulation; 3 month; FTIR; amorphous region; crystal region; dry-cured XLPE power cable; moisture content; optical microscopy; residual ac breakdown voltage; wet-accelerated aging tests; Aging; Breakdown voltage; Cable insulation; Electric breakdown; Life estimation; Moisture; Optical microscopy; Power cables; Testing; Wire;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
