The residual ac breakdown voltage of 6.6 kV dry-cured XLPE power cable under wet-accelerated aging tests

Author

Hashizume, T. ; Shinoda, C. ; Nakamura, K. ; Hotta, M. ; Tani, T.

Author_Institution

Power Cable R&D, Yazaki Electric Wire Co. Ltd., Numazu, Japan

Volume

5

Issue

2

fYear

1998

fDate

4/1/1998 12:00:00 AM

Firstpage

169

Lastpage

173

Abstract

The residual ac breakdown voltage decreased to about half of the initial breakdown voltage after 3 months of accelerated aging test under immersion. This decrease was found to be caused mainly by a trace amount of moisture existing in the insulation. However, the breakdown voltage did not further decrease with increasing moisture content. In order to clarify the influence of moisture, the state of water existing in the insulation was investigated using FTIR (Fourier transform infrared spectroscopy) and optical microscopy. From these results, it was concluded that the moisture in the amorphous region and/or at the interface next to the crystal region caused the reduction of the ac breakdown voltage

Keywords

Fourier transform spectroscopy; XLPE insulation; ageing; infrared spectroscopy; insulation testing; life testing; optical microscopy; power cable insulation; 3 month; FTIR; amorphous region; crystal region; dry-cured XLPE power cable; moisture content; optical microscopy; residual ac breakdown voltage; wet-accelerated aging tests; Aging; Breakdown voltage; Cable insulation; Electric breakdown; Life estimation; Moisture; Optical microscopy; Power cables; Testing; Wire;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/94.671925

Filename

671925