External PD resistance of thermoplastic and XLPE containing voltage stabilizers

Author

Roseen, P.A. ; Gubanski, S.M. ; Gedde, U.W.

Author_Institution

Dept. of Polymer Technol., R. Inst. of Technol., Stockholm, Sweden

Volume

5

Issue

2

fYear

1998

fDate

4/1/1998 12:00:00 AM

Firstpage

189

Lastpage

194

Abstract

Films based on a wide range of thermoplastic and XLPE (crosslinked polyethylene) including compounds containing aromatic voltage stabilizers (fluoranthene, naphthalene, pyrene, vinylnaphthalene and anthracene) were exposed to external PD (partial discharge) in dry air at 298 K. Very low molar mass PE, M¯_w=13600 g/mol, exhibited a very low resistance towards PD. It is believed that the low concentration of interlamellar tie chains and the pronounced mechanical brittleness caused early void formation induced by the mechanical action of the plasma. PE with a higher molar mass showed a PD life that was essentially independent of molar mass, degree of crosslinking, crystallinity and crystal thickness. The added voltage stabilizers had no effect on the PD lifetime

Keywords

XLPE insulation; brittleness; insulation testing; life testing; partial discharges; plastics; power cable insulation; 298 K; XLPE; aromatic voltage stabilizers; crosslinking; crystal thickness; crystallinity; dry air; external PD resistance; interlamellar tie chains; mechanical brittleness; molar mass; thermoplastic; void formation; Additives; Crystallization; Manufacturing; Partial discharges; Polyethylene; Polymer films; Rough surfaces; Surface roughness; Thermal resistance; Voltage;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/94.671928

Filename

671928