Title :
Study on optimized design of BIT system of electronic equipments in special vehicle
Author :
Wei Wei ; Sheng-cai Li ; Zhen-ming Peng ; Jin-song Rao ; Xiang-pu Ji ; Hui Cheng ; Ming-jie Hou
Author_Institution :
Beijing Special Vehicle Res. Inst., Beijing, China
fDate :
Aug. 31 2014-Sept. 3 2014
Abstract :
In view of the prominent difficulty in fault diagnosis for various failures of special vehicle´s electronic equipments, a specialized research on optimized design of BIT system is carried out, and a strategy for calculating optimal testing items set is presented based on a two-step new method. Through this strategy, the complexity and expenses of BIT system are achieved global optimization by introducing the weighted expenses function to calculating minimum testing items set. The research achievement of this paper will have experimental guidance in design of online fault diagnosis for special vehicle´s electronic equipments.
Keywords :
automotive electronics; integrated circuit design; integrated circuit testing; BIT system; electronic equipments; optimal testing; optimized design; special vehicle; vehicle electronic equipment; Circuit faults; Electronic equipment; Fault diagnosis; Testing; Vehicles;
Conference_Titel :
Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-4240-4
DOI :
10.1109/ITEC-AP.2014.6941209