DocumentCode
136961
Title
Study on optimized design of BIT system of electronic equipments in special vehicle
Author
Wei Wei ; Sheng-cai Li ; Zhen-ming Peng ; Jin-song Rao ; Xiang-pu Ji ; Hui Cheng ; Ming-jie Hou
Author_Institution
Beijing Special Vehicle Res. Inst., Beijing, China
fYear
2014
fDate
Aug. 31 2014-Sept. 3 2014
Firstpage
1
Lastpage
3
Abstract
In view of the prominent difficulty in fault diagnosis for various failures of special vehicle´s electronic equipments, a specialized research on optimized design of BIT system is carried out, and a strategy for calculating optimal testing items set is presented based on a two-step new method. Through this strategy, the complexity and expenses of BIT system are achieved global optimization by introducing the weighted expenses function to calculating minimum testing items set. The research achievement of this paper will have experimental guidance in design of online fault diagnosis for special vehicle´s electronic equipments.
Keywords
automotive electronics; integrated circuit design; integrated circuit testing; BIT system; electronic equipments; optimal testing; optimized design; special vehicle; vehicle electronic equipment; Circuit faults; Electronic equipment; Fault diagnosis; Testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
Conference_Location
Beijing
Print_ISBN
978-1-4799-4240-4
Type
conf
DOI
10.1109/ITEC-AP.2014.6941209
Filename
6941209
Link To Document