Technology 1991: test and measurement

Author

Fitzgerald, K.

Volume

28

Issue

1

fYear

1991

fDate

1/1/1991 12:00:00 AM

Firstpage

56

Lastpage

58

Abstract

Developments during 1990 are highlighted. Boundary scan, a method for designing testability into microelectronics and printed-circuit boards, came to market in 1990 in an array or products ranging from application-specific ICs (ASICs) to logic analyzers. The field of communications testing was marked in 1990 by the bid of a new analysis technique, modulation domain analysis, for mainstream applications inside and outside communications, including disk-drive testing. The adoption a few years ago of a standard for the VXI (VME extensions for instrumentation) modular instrumentation bus is finally bearing fruit in a cornucopia of new products. A smart tester, incorporating artificial intelligence techniques, came on the market

Keywords

automatic test equipment; computer interfaces; electronic equipment testing; logic analysers; ASIC; VME extensions; VXI bus; artificial intelligence techniques; boundary scan method; communications testing; disk-drive testing; instrumentation bus; logic analyzers; microelectronics; modulation domain analysis; printed-circuit boards; smart tester; testability design; Application specific integrated circuits; Automatic testing; Circuit testing; Consumer electronics; Electronic equipment testing; Instruments; Logic arrays; Logic testing; Microprocessors; System testing;

fLanguage

English

Journal_Title

Spectrum, IEEE

Publisher

ieee

ISSN

0018-9235

Type

jour

DOI

10.1109/6.67242

Filename

67242