• DocumentCode
    136998
  • Title

    Current measurement gain tuning for interior permanent magnet synchronous motor (IPMSM) drives using controlled short circuit tests

  • Author

    Siwei Cheng ; Dong Wang ; Junquan Chen

  • Author_Institution
    NUE, Inst. of Power Electron. Technol., Wuhan, China
  • fYear
    2014
  • fDate
    Aug. 31 2014-Sept. 3 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a nonintrusive method to automatically identify and compensate for current measurement errors in interior permanent magnet synchronous motor (IPMSM) drives. Each IPM motor has a distinct short-circuit current vs. speed characteristic, which is solely defined by its machine design. By controlling the IPM motor to operate at its steady-state short-circuit current during coasting down, all phases of the IPM motor can be safely short circuited using the inverter without introducing any current transients. Then the d-q axis currents measured by the inverter are compared with the known short-circuit characteristic of the IPM motor. The distortion pattern in the d-q axis currents contains all the information needed to correct for current sensor errors in IPMSM drives.
  • Keywords
    electric current measurement; invertors; permanent magnet motors; synchronous motor drives; IPM motor; IPMSM drives; controlled short circuit tests; current measurement errors; current measurement gain tuning; current sensor errors; current transients; d-q axis currents; distortion pattern; interior permanent magnet synchronous motor; inverter; machine design; nonintrusive method; short-circuit characteristic; speed characteristic; steady-state short-circuit current; Current measurement; Permanent magnet motors; Short-circuit currents; Synchronous motors; Trajectory; Transient analysis; Vectors; Interior permanent magnet motor; current sensor; gain tuning; motor control; motor drive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-4240-4
  • Type

    conf

  • DOI
    10.1109/ITEC-AP.2014.6941238
  • Filename
    6941238