DocumentCode :
1370180
Title :
Thermal modeling of electrical contacts in switches and relays
Author :
Leung, Chi H. ; Lee, Anthony ; Wang, Bor-Jenq
Author_Institution :
Dept. of Electr. & Electron., GM R&D Centre, Warren, MI, USA
Volume :
19
Issue :
3
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
346
Lastpage :
352
Abstract :
A thermal modeling procedure has been developed to calculate the temperature distribution of components in complex three-dimensional (3-D) switches and relays. The methods developed for dissecting the components, treating of thermal interaction among the components, and calculating of interface thermal resistance are reported. In particular, the knowledge of electrical “a-spot” is used to estimate solid-solid contact area and void area. The void areas do not contribute to electrical conductivity but do contribute to thermal conductivity. The method is used to more accurately estimate the interface thermal resistance which is very important in any thermal analysis program. Actual switches and relays were modeled using finite difference thermal analysis, and the results matched well with measured temperatures
Keywords :
electrical contacts; finite difference methods; relays; switches; temperature distribution; thermal analysis; thermal resistance; T-SNAP program; a-spot; electrical conductivity; electrical contact; finite difference thermal analysis; interface thermal resistance; relay; solid-solid contact area; switch; temperature distribution; thermal conductivity; thermal model; three-dimensional component; void area; Contacts; Electric resistance; Electrical resistance measurement; Finite difference methods; Relays; Switches; Temperature distribution; Temperature measurement; Thermal conductivity; Thermal resistance;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.536836
Filename :
536836
Link To Document :
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