• DocumentCode
    1370289
  • Title

    Study of the ground bounce caused by power plane resonances

  • Author

    Van Den Berghe, S. ; Olyslager, F. ; De Zutter, D. ; De Moerloose, J. ; Temmerman, W.

  • Author_Institution
    Dept. of Inf. Technol., Ghent Univ., Belgium
  • Volume
    40
  • Issue
    2
  • fYear
    1998
  • fDate
    5/1/1998 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    119
  • Abstract
    We describe Delta-I noise caused by power plane resonances in multilayer boards. First, we study the effect of power plane resonances on the ground bounce of the system by performing finite-difference time-domain (FDTD) simulations. We simulate the voltage fluctuations at one point of the printed circuit board (PCB) due to a current surge between the power planes in a different point. Next, two methods to prevent this ground bounce effect are investigated. The first method consists of adding lumped capacitances to the design. The effect of one large capacitor is compared to the effect of adding a “wall” of smaller capacitors. A second approach is to isolate the chips by etching a slot around the sensitive integrated circuits (ICs) and connecting both sides by a small inductor. Both methods provide excellent protection against power plane resonances
  • Keywords
    capacitors; circuit noise; finite difference time-domain analysis; inductors; printed circuits; resonance; surge protection; switching; transients; Delta-I noise; FDTD simulations; IC switching; PCB; capacitor; current surge; finite-difference time-domain; ground bounce; inductor; integrated circuits; lumped capacitances; multilayer boards; power plane resonance protection; printed circuit board; slot; transient currents; voltage fluctuations; Capacitors; Circuit noise; Circuit simulation; Finite difference methods; Nonhomogeneous media; Printed circuits; Resonance; Surges; Time domain analysis; Voltage fluctuations;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.673616
  • Filename
    673616