A quasi-static tool for the EMI/EMC analysis of analog circuits: parasitic extractor tool and simulator of EMI parameters (PET+SEP)

Author

Piedra, S. ; Fernández, J.E. ; Basterrechea, J. ; Cátedra, M.F.

Author_Institution

Dept. de Ingenieria de Commun., Cantabria Univ., Santander, Spain

Volume

40

Issue

2

fYear

1998

fDate

5/1/1998 12:00:00 AM

Firstpage

127

Lastpage

138

Abstract

A quasi-static approach for evaluating inductive and capacitive coupling and radiated noise in the standard electromagnetic compatibility (EMC) measurement conditions has been developed. Multilayer structures are analyzed considering a quasi-static Green´s function formulation. Variational approaches have been followed to compute inductive and capacitive parasitics. Electric and magnetic multipolar expansions are used for a fast computation of near- and far-field radiated noise in a large broad band. The approach has been validated by considering different cases ranging from simple circuits to realistic switched-mode power supplies and some of the validation cases are presented. The main advantages of this method is the short central processing unit (CPU) time it requires to provide reliable results for EMC analysis and design purposes

Keywords

analogue circuits; capacitance; circuit analysis computing; electromagnetic compatibility; electromagnetic interference; inductance; printed circuits; software packages; software tools; CPU time; EMC design; EMC measurement; EMI parameters; EMI/EMC analysis; PCB; PET; SEP; analog circuits; capacitive parasitics; central processing unit; electric multipolar expansion; electromagnetic compatibility; far-field radiated noise; inductive parasitics; magnetic multipolar expansion; multilayer structures; near-field radiated noise; parasitic extractor tool; quasi-static Green´s function; quasi-static tool; radiated noise; simulator; software package; switched-mode power supplies; variational approaches; Analog circuits; Central Processing Unit; Circuit analysis; Circuit noise; Coupling circuits; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic interference; Magnetic analysis; Magnetic noise;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.673618

Filename

673618