DocumentCode :
1370366
Title :
A seven-element S-band coupled-oscillator controlled agile-beam phased array
Author :
Pogorzelski, Ronald J. ; Scaramastra, Rocco P. ; Huang, John ; Beckon, Robert J. ; Petree, Steven M. ; Chavez, Cosme M.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
48
Issue :
8
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
1375
Lastpage :
1384
Abstract :
This paper describes the design, fabrication, and testing of a seven-element S-band phased array, in which the beam is steered by means of a coupled-oscillator technique. Seven monolithic-microwave integrated-circuit-based voltage-controlled oscillators were coupled via microstrip transmission lines in such a manner that they mutually injection locked and, thus, oscillated as an ensemble. The output of each oscillator was connected to a microstrip patch array element and the seven elements were disposed in a line on a Duroid substrate. The resulting antenna was characterized in benchtop tests, revealing the relative phase behavior of the oscillators, and in range tests, producing far-field pattern cuts. Patterns showing beams steered to several angles were obtained by applying appropriate tuning voltages to the end oscillators of the array
Keywords :
MMIC oscillators; antenna phased arrays; antenna radiation patterns; injection locked oscillators; microstrip antenna arrays; voltage-controlled oscillators; Duroid substrate; MMIC voltage-controlled oscillators; S-band; agile-beam phased array; benchtop tests; coupled-oscillator controlled array; end oscillators; far-field pattern cuts; microstrip transmission lines; mutual injection locking; patch array element; relative phase behavior; tuning voltages; Antenna arrays; Coupling circuits; Injection-locked oscillators; Microstrip antenna arrays; Mutual coupling; Nearest neighbor searches; Phased arrays; Testing; Tuning; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.859483
Filename :
859483
Link To Document :
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