Title :
Direct measurement of crosstalk between integrated differential circuits
Author :
Bockelman, David E. ; Eisenstadt, William R.
Author_Institution :
Motorola Florida Commun. Res. Lab., Plantation, FL, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
Silicon integrated-circuit test structures have been fabricated that allow direct measurement of crosstalk between differential transmission lines and between single-ended transmission lines in the presence of metal ground plane. The differential test structures are characterized with mixed-mode scattering parameters (common mode, differential mode, and mode conversion), as measured with the pure-mode vector network analyzer. Comparisons with simulation show good agreement for differential-mode crosstalk, and the dependence of crosstalk on transmission-line separation is presented. Difficulties in simulating crosstalk fur even simple structures illustrate the utility of direct measurement of crosstalk
Keywords :
MMIC; S-parameters; differentiating circuits; elemental semiconductors; integrated circuit testing; network analysers; network parameters; silicon; Si; common mode; crosstalk; differential mode; differential transmission lines; direct measurement; integrated differential circuits; integrated-circuit test structures; metal ground plane.; mixed-mode scattering parameters; mode conversion; pure-mode vector network analyzer; single-ended transmission lines; transmission-line separation; Circuit simulation; Circuit testing; Crosstalk; Distributed parameter circuits; Integrated circuit measurements; Probes; Scattering parameters; Transmission line measurements; Transmission line theory; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
