Direct measurement of crosstalk between integrated differential circuits

Author

Bockelman, David E. ; Eisenstadt, William R.

Author_Institution

Motorola Florida Commun. Res. Lab., Plantation, FL, USA

Volume

48

Issue

8

fYear

2000

fDate

8/1/2000 12:00:00 AM

Firstpage

1410

Lastpage

1413

Abstract

Silicon integrated-circuit test structures have been fabricated that allow direct measurement of crosstalk between differential transmission lines and between single-ended transmission lines in the presence of metal ground plane. The differential test structures are characterized with mixed-mode scattering parameters (common mode, differential mode, and mode conversion), as measured with the pure-mode vector network analyzer. Comparisons with simulation show good agreement for differential-mode crosstalk, and the dependence of crosstalk on transmission-line separation is presented. Difficulties in simulating crosstalk fur even simple structures illustrate the utility of direct measurement of crosstalk

Keywords

MMIC; S-parameters; differentiating circuits; elemental semiconductors; integrated circuit testing; network analysers; network parameters; silicon; Si; common mode; crosstalk; differential mode; differential transmission lines; direct measurement; integrated differential circuits; integrated-circuit test structures; metal ground plane.; mixed-mode scattering parameters; mode conversion; pure-mode vector network analyzer; single-ended transmission lines; transmission-line separation; Circuit simulation; Circuit testing; Crosstalk; Distributed parameter circuits; Integrated circuit measurements; Probes; Scattering parameters; Transmission line measurements; Transmission line theory; Transmission lines;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.859489

Filename

859489