Title :
A CMOS 0.8-/spl mu/m transistor-only 1.63-MHz switched-current bandpass /spl Sigma//spl Delta/ modulator for AM signal A/D conversion
Author :
De la Rosa, José M. ; Pérez-VerdÙ, Belén ; Río, Rocío Del ; Rodríguez-Vázquez, Angel
Author_Institution :
IMSE, CSIC, Sevilla, Spain
Abstract :
This paper presents a CMOS 0.8-/spl mu/m switched-current (SI) fourth-order bandpass /spl Sigma//spl Delta/ modulator (BP-/spl Sigma//spl Delta/M) IC capable of handling signals up to 1.63 MHz with 105-bit resolution and 60-mW power consumption from a 5-V supply voltage. This modulator Is intended for direct A/D conversion of narrow-band signals within the commercial AM band, from 530 kHz to 1.6 MHz. Its architecture is obtained by applying a low-pass-to-bandpass transformation (z/sup -1//spl rarr/-z/sup -2/) to a 1-bit second-order low-pass /spl Sigma//spl Delta/ modulator (LP-/spl Sigma//spl Delta/M). The design of basic building blocks is based upon a detailed analysis of the influence of SI errors on the modulator performance, followed by design optimization. Memory-cell errors have been identified as the dominant ones. In order to attenuate these errors, fully differential regulated-folded cascode memory cells are employed. Measurements show a best SNR peak of 65 dB for signals of 10-kHz bandwidth and an intermediate frequency (IF) of 1.63 MHz. A correct noise-shaping filtering is achieved with a sampling frequency of up to 16 MHz.
Keywords :
CMOS integrated circuits; circuit optimisation; integrated circuit design; sigma-delta modulation; switched current circuits; 0.8 micron; 1.63 MHz; 10 kHz; 5 V; 540 kHz to 1.6 MHz; 60 mW; A/D conversion; AM signal; CMOS; SNR peak; design optimization; fully differential regulated-folded cascode memory cells; intermediate frequency; low-pass-to-bandpass transformation; narrow-band signals; noise-shaping filtering; power consumption; resolution; sampling frequency; switched-current bandpass sigma-delta modulator; Bandwidth; CMOS integrated circuits; Design optimization; Energy consumption; Frequency measurement; Narrowband; Noise shaping; Performance analysis; Signal resolution; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of