DocumentCode :
1370603
Title :
Phase noise in LC oscillators
Author :
Kouznetsov, Konstantin A. ; Meyer, Robert G.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
35
Issue :
8
fYear :
2000
Firstpage :
1244
Lastpage :
1248
Abstract :
Analytical methods for the phase-noise analysis of LC-tuned oscillators are presented. The fundamental assumption used in the theoretical model is that an oscillator acts as a large-signal LC-tuned amplifier for purposes of noise analysis. This approach allows us to derive closed-form expressions for the close-to-carrier spectral density of the output noise, and to estimate the phase-noise performance of an oscillator from circuit parameters using hand analysis. The emphasis is on an engineering approach intended to facilitate rapid estimation of oscillator phase noise. Theoretical predictions are compared with results of circuit simulations using a nonlinear phase-noise simulator. The analytical results are in good agreement with simulations for weakly nonlinear oscillators. Complete nonlinear simulations are necessary to accurately predict phase noise in oscillators operating in a strongly nonlinear regime. To confirm the validity of the nonlinear phase-noise models implemented in the simulator, simulation results are compared with measurements of phase noise in a practical Colpitts oscillator, where we find good agreement between simulations and measurements.
Keywords :
circuit simulation; network parameters; nonlinear network analysis; phase noise; variable-frequency oscillators; voltage-controlled oscillators; Colpitts oscillator; LC oscillators; circuit parameters; circuit simulations; close-to-carrier spectral density; closed-form expressions; large-signal LC-tuned amplifier; phase-noise analysis; strongly nonlinear regime; tuned oscillators; weakly nonlinear oscillators; Circuit noise; Circuit simulation; Closed-form solution; Noise measurement; Oscillators; Performance analysis; Phase estimation; Phase measurement; Phase noise; Predictive models;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.859518
Filename :
859518
Link To Document :
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