DocumentCode :
1370827
Title :
The spreading and interface resistances of electric contacts
Author :
Little, Clarence W. ; Kouwenhoven, William B.
Author_Institution :
Johns Hopkins University, School of Engineering, Baltimore, Md.; Research Division, Auis-Chalmers Manufacturing Company, Milwaukee, Wis.
Volume :
72
Issue :
5
fYear :
1953
Firstpage :
314
Lastpage :
323
Abstract :
In almost every electric circuit there axe one or more places where current passes from one continuous metal body to another across the interface separating the two. The presence of the interface introduces an additional resistance into the circuit, and this additional resistance has for many years been called contact resistance. For over a century the contact resistance was thought to arise entirely from the potential drop through which charge must pass in going across the interface from one body to the other, and this was considered to be the only resistance of a contact. Today, it is known that the deviation from a uniform current field caused by the constriction of the current to a few small conducting areas at the interface also contributes to the contact resistance. A recent paper1 by one of the authors describes some of the more important effects of this latter phenomenon.
Keywords :
Conductors; Contact resistance; Equations; Films; Immune system; Metals;
fLanguage :
English
Journal_Title :
American Institute of Electrical Engineers, Part II: Applications and Industry, Transactions of the
Publisher :
ieee
ISSN :
0097-2185
Type :
jour
DOI :
10.1109/TAI.1953.6371352
Filename :
6371352
Link To Document :
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