DocumentCode :
1371302
Title :
Simultaneously Fitting and Segmenting Multiple-Structure Data with Outliers
Author :
Wang, Hanzi ; Chin, Tat-Jun ; Suter, David
Author_Institution :
Sch. of Inf. Sci. & Technol., Xiamen Univ., Xiamen, China
Volume :
34
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
1177
Lastpage :
1192
Abstract :
We propose a robust fitting framework, called Adaptive Kernel-Scale Weighted Hypotheses (AKSWH), to segment multiple-structure data even in the presence of a large number of outliers. Our framework contains a novel scale estimator called Iterative Kth Ordered Scale Estimator (IKOSE). IKOSE can accurately estimate the scale of inliers for heavily corrupted multiple-structure data and is of interest by itself since it can be used in other robust estimators. In addition to IKOSE, our framework includes several original elements based on the weighting, clustering, and fusing of hypotheses. AKSWH can provide accurate estimates of the number of model instances and the parameters and the scale of each model instance simultaneously. We demonstrate good performance in practical applications such as line fitting, circle fitting, range image segmentation, homography estimation, and two--view-based motion segmentation, using both synthetic data and real images.
Keywords :
curve fitting; image segmentation; iterative methods; pattern clustering; adaptive kernel-scale weighted hypotheses; circle fitting; heavily corrupted multiple-structure data; homography estimation; hypothese clustering; hypotheses fusing; inliers scale estimate; iterative Kth ordered scale estimator; line fitting; multiple-structure data fitting; multiple-structure data segmentation; range image segmentation; real images; robust fitting framework; synthetic data; two-view-based motion segmentation; Bandwidth; Computational modeling; Data models; Estimation; Fitting; Kernel; Robustness; Robust statistics; kernel density estimation; model fitting; multiple structure segmentation.; scale estimation;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2011.216
Filename :
6072213
Link To Document :
بازگشت