Title :
Latent Log-Linear Models for Handwritten Digit Classification
Author :
Deselaers, Thomas ; Gass, Tobias ; Heigold, Georg ; Ney, Hermann
Author_Institution :
Google Switzerland, Zurich, Switzerland
fDate :
6/1/2012 12:00:00 AM
Abstract :
We present latent log-linear models, an extension of log-linear models incorporating latent variables, and we propose two applications thereof: log-linear mixture models and image deformation-aware log-linear models. The resulting models are fully discriminative, can be trained efficiently, and the model complexity can be controlled. Log-linear mixture models offer additional flexibility within the log-linear modeling framework. Unlike previous approaches, the image deformation-aware model directly considers image deformations and allows for a discriminative training of the deformation parameters. Both are trained using alternating optimization. For certain variants, convergence to a stationary point is guaranteed and, in practice, even variants without this guarantee converge and find models that perform well. We tune the methods on the USPS data set and evaluate on the MNIST data set, demonstrating the generalization capabilities of our proposed models. Our models, although using significantly fewer parameters, are able to obtain competitive results with models proposed in the literature.
Keywords :
handwritten character recognition; image classification; regression analysis; support vector machines; MNIST data set; USPS data set; discriminative deformation parameter training; handwritten digit classification; image deformation-aware log-linear models; latent log-linear mixture models; stationary point convergence; Approximation methods; Data models; Deformable models; Hidden Markov models; Kernel; Numerical models; Training; Log-linear models; OCR; conditional random fields; image classification.; latent variables; Algorithms; Image Interpretation, Computer-Assisted; Linear Models; Natural Language Processing; Pattern Recognition, Automated;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2011.218