• DocumentCode
    1371344
  • Title

    Generalized linear models in software reliability: parametric and semi-parametric approaches

  • Author

    El Aroui, Mhamed-Ali ; Lavergne, Christian

  • Author_Institution
    Lab. de Modelisation et Calcul, IMAG, Grenoble, France
  • Volume
    45
  • Issue
    3
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    463
  • Lastpage
    470
  • Abstract
    The penalized likelihood method is used for a new semi-parametric software reliability model. This new model is a nonparametric generalization of all parametric models where the failure intensity function depends only on the number of observed failures, viz. number-of-failures models (NF). Experimental results show that the semi-parametric model generally fits better and has better 1-step predictive quality than parametric NF. Using generalized linear models, this paper presents new parametric models (polynomial models) that have performances (deviance and predictive-qualities) approaching those of the semi-parametric model. Graphical and statistical techniques are used to choose the appropriate polynomial model for each data-set. The polynomial models are a very good compromise between the nonvalidity of the simple assumptions of classical NF, and the complexity of use and interpretation of the semi-parametric model. The latter represents a reference model that we approach by choosing adequate link and regression functions for the polynomial models
  • Keywords
    failure analysis; maximum likelihood estimation; polynomials; software reliability; 1-step predictive quality; failure intensity function; generalized linear models; graphical techniques; link functions; nonparametric generalization; number-of-failures models; parametric approach; penalized likelihood method; polynomial models; regression functions; semi-parametric approach; software reliability; statistical techniques; Exponential distribution; History; Maximum likelihood estimation; Noise measurement; Parametric statistics; Polynomials; Predictive models; Software reliability; Solid modeling; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.537017
  • Filename
    537017