Title :
Generalized linear models in software reliability: parametric and semi-parametric approaches
Author :
El Aroui, Mhamed-Ali ; Lavergne, Christian
Author_Institution :
Lab. de Modelisation et Calcul, IMAG, Grenoble, France
fDate :
9/1/1996 12:00:00 AM
Abstract :
The penalized likelihood method is used for a new semi-parametric software reliability model. This new model is a nonparametric generalization of all parametric models where the failure intensity function depends only on the number of observed failures, viz. number-of-failures models (NF). Experimental results show that the semi-parametric model generally fits better and has better 1-step predictive quality than parametric NF. Using generalized linear models, this paper presents new parametric models (polynomial models) that have performances (deviance and predictive-qualities) approaching those of the semi-parametric model. Graphical and statistical techniques are used to choose the appropriate polynomial model for each data-set. The polynomial models are a very good compromise between the nonvalidity of the simple assumptions of classical NF, and the complexity of use and interpretation of the semi-parametric model. The latter represents a reference model that we approach by choosing adequate link and regression functions for the polynomial models
Keywords :
failure analysis; maximum likelihood estimation; polynomials; software reliability; 1-step predictive quality; failure intensity function; generalized linear models; graphical techniques; link functions; nonparametric generalization; number-of-failures models; parametric approach; penalized likelihood method; polynomial models; regression functions; semi-parametric approach; software reliability; statistical techniques; Exponential distribution; History; Maximum likelihood estimation; Noise measurement; Parametric statistics; Polynomials; Predictive models; Software reliability; Solid modeling; Stochastic processes;
Journal_Title :
Reliability, IEEE Transactions on