DocumentCode :
1371359
Title :
POWER7™, a Highly Parallel, Scalable Multi-Core High End Server Processor
Author :
Wendel, Dieter F. ; Kalla, Ron ; Warnock, James ; Cargnoni, Robert ; Chu, Sam G. ; Clabes, Joachim G. ; Dreps, Daniel ; Hrusecky, David ; Friedrich, Josh ; Islam, Saiful ; Kahle, Jim ; Leenstra, Jens ; Mittal, Gaurav ; Paredes, Jose ; Pille, Juergen ; Res
Author_Institution :
IBM R&D GmbH, Boeblingen, Germany
Volume :
46
Issue :
1
fYear :
2011
Firstpage :
145
Lastpage :
161
Abstract :
This paper gives an overview of the latest member of the POWER™ processor family, POWER7™. Eight quad-threaded cores, operating at frequencies up to 4.14 GHz, are integrated together with two memory controllers and high speed system links on a 567 mm die, employing 1.2B transistors in a 45 nm CMOS SOI technology with 11 layers of low-k copper wiring. The technology features deep trench capacitors which are used to build a 32 MB embedded DRAM L3 based on a 0.067 m DRAM cell. The functionally equivalent chip transistor count would have been over 2.7B if the L3 had been implemented with a conventional 6 transistor SRAM cell. (A detailed paper about the eDRAM implementation will be given in a separate paper of this Journal). Deep trench capacitors are also used to reduce on-chip voltage island supply noise. This paper describes the organization of the design and the features of the processor core, before moving on to discuss the circuits used for analog elements, clock generation and distribution, and I/O designs. The final section describes the details of the clocked storage elements, including special features for test, debug, and chip frequency tuning.
Keywords :
DRAM chips; SRAM chips; capacitors; microprocessor chips; multiprocessing systems; transistors; CMOS SOI technology; POWER7 processor; chip transistor count; clocked storage elements; debug feature; deep trench capacitors; dynamic random access memory; embedded DRAM L3; frequency tuning feature; multicore server processor; quad-threaded cores; silicon-on-insulator technology; static random access moemory; test feature; transistor SRAM cell; Clocks; Computer architecture; Microprocessors; Multiplexing; Random access memory; Registers; Transistors; CML circuits; debug features; Clocked storage element design; L3 cache; LBIST; POWER processor; POWER7; SER; SEU; SMP; SOI; clock grid; deep trench capacitor; design for reliability; design for test; differential I/O; digital PLL; duty cycle correction; eight core processor; embedded DRAM; flip-flop design; high-speed I/O; latch; microprocessor; multi-core; multiport SRAM; pulsed-clock latch; quad-threaded core; vector register file; vector scalar unit;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2010.2080611
Filename :
5623304
Link To Document :
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