DocumentCode
1371570
Title
p-GaSb/n-GaAs heterojunction diodes for TPV and solar cell applications
Author
Zheng, L. ; Haywood, S.K. ; Mason, N.J. ; Verschoor, G.
Author_Institution
Sch. of Eng., Hull Univ., UK
Volume
147
Issue
3
fYear
2000
fDate
6/1/2000 12:00:00 AM
Firstpage
205
Lastpage
208
Abstract
A series of samples has been grown to investigate the effect of doping and GaSb epilayer thickness on dark and photo I-V curves, and on spectral response. The optimum GaSb thickness is a trade-off between the diffusion length and the thickness required to maximise light absorption. The highest open circuit voltage, Voc~0.33 V, to date has been obtained from a thin (0.3 μm) GaSb layer doped at 6×1019 cm-1, under illumination by a focused tungsten-halogen lamp (~1 W cm-2). The short circuit current, Ioc, was ~13 mA/cm2 with a corresponding fill factor of 0.63, and an external quantum efficiency of ~10%. The devices were not anti-reflection coated, and some parameters important for solar cells, such as contact form and series resistance, have not been optimised. The shape of the spectral response is strongly dependent on GaSb thickness. Increasing the thickness of the epilayer increases the external quantum efficiency above 870 nm (i.e. above the GaAs band edge) while the external quantum efficiency in the short wavelength range (below 870 nm) reduces
Keywords
MOCVD; dark conductivity; diffusion; heterojunction bipolar transistors; optical focusing; solar cells; thermophotovoltaic cells; vapour phase epitaxial growth; 0.3 mum; 0.33 V; 10 percent; 870 nm; GaAs; GaSb; GaSb epilayer thickness; GaSb thickness; TPV; band edge; contact form; diffusion length; doping; epilayer thickness; external quantum efficiency; focused tungsten-halogen lamp; light absorption; open circuit voltage; optimum GaSb thickness; p-GaSb/n-GaAs heterojunction diodes; photo I-V curves; series resistance; short circuit current; solar cell applications; solar cells; spectral response; thin GaSb layer;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:20000551
Filename
860919
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