DocumentCode :
1371605
Title :
Kudos to our reviewers
Author :
Verret, Doug
Author_Institution :
Texas Instruments, Inc., Austin, USA
Volume :
58
Issue :
12
fYear :
2011
Firstpage :
4120
Lastpage :
4120
Abstract :
The publication offers a note of thanks and lists its reviewers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2171793
Filename :
6072258
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1371605
