Title :
Defects tail off with six-sigma manufacturing
Author :
Fieler, P.E. ; Loverro, N.
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
A description is given of the six-sigma technique, the goal of which is to aid in the design of products that will function as intended, despite variations of 6 sigma ( sigma is the standard deviation) in their physical/operating parameters. The six-sigma metric provides a statistically defined yardstick for quantifying a product´s level of quality, using process capability indices. The meaning of the indices and why they are useful are explained. The use of Shewhart statistical process control (SPC) charts is briefly discussed. The six steps in the six-sigma program are outlined.<>
Keywords :
integrated circuit manufacture; quality control; semiconductor device manufacture; statistical process control; Shewhart SPC charts; process capability indices; product design; quality control; semiconductor manufacturing; six-sigma manufacturing; statistical process control; Humans; Manufacturing processes; Probability distribution; Process control; Product design; Production; Raw materials; Roads; Robustness; Tail;
Journal_Title :
Circuits and Devices Magazine, IEEE
