• DocumentCode
    1371826
  • Title

    Fast time domain simulation of generic resonant mode power converter: mapping the stability region

  • Author

    Brown, A.D. ; Wong, S.C. ; Williams, A.C. ; Kazmierski, T.J.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    147
  • Issue
    4
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    211
  • Lastpage
    218
  • Abstract
    A macromodelling technique for generic resonant-mode power converters is described. This technique enables the transient and frequency analyses of resonant converters, embedded in their control circuitry, to be carried out some three orders of magnitude faster than by full component-level circuit simulation. This increase in speed enables `an analysis´ to be treated as a primitive operation and allows more complex interactions of an entire system to be explored. The paper describes the technique, and demonstrates the power of the idea with a much higher level analysis; a resonant-mode converter controlled by a feedback system, driving a complex load. Like any physical system of this nature, there are combinations of system parameters that can cause overall instability (oscillation). In a power conversion environment, this can be extremely dangerous. The example shown uses a three-component load (R, L, C) and generates the `stability surface´ in {R, L, C} space that separates the stable from the unstable regions of overall operation. This also demonstrates that the volume of `component space´ enclosed by the stability surface decreases monotonically with increasing system phase margin
  • Keywords
    circuit simulation; circuit stability; nonlinear network analysis; resonant power convertors; time-domain analysis; transient analysis; complex load; control circuitry embeded convertors; fast time domain simulation; feedback system; frequency analysis; generic resonant mode power converter; instability; macromodelling technique; oscillation; stability region mapping; system phase margin; transient analysis;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:20000338
  • Filename
    861387