Title :
Limitations on the extraction of loss tangent from submicron transmission line test structures
Author :
Friar, Robert J. ; Neikirk, Dean P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
When two-port S-parameters are used to characterize microstrip transmission line test structures, finite phase measurement precision, small reference plane offsets, and signals below the measurement threshold can significantly limit the ability to extract loss tangent from transmission lines with finite series resistance. By considering these errors, it is possible to select test structure geometries that minimize the impact of these errors
Keywords :
S-parameters; dielectric loss measurement; measurement errors; microstrip lines; microwave measurement; dielectric loss tangent; measurement errors; microstrip transmission line; parameter extraction; test structure; two-port S-parameters; Circuit testing; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Geometry; Materials testing; Microstrip; Propagation losses; Transmission lines;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/6040.861552
