DocumentCode
1372148
Title
Limitations on the extraction of loss tangent from submicron transmission line test structures
Author
Friar, Robert J. ; Neikirk, Dean P.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume
23
Issue
3
fYear
2000
fDate
8/1/2000 12:00:00 AM
Firstpage
393
Lastpage
397
Abstract
When two-port S-parameters are used to characterize microstrip transmission line test structures, finite phase measurement precision, small reference plane offsets, and signals below the measurement threshold can significantly limit the ability to extract loss tangent from transmission lines with finite series resistance. By considering these errors, it is possible to select test structure geometries that minimize the impact of these errors
Keywords
S-parameters; dielectric loss measurement; measurement errors; microstrip lines; microwave measurement; dielectric loss tangent; measurement errors; microstrip transmission line; parameter extraction; test structure; two-port S-parameters; Circuit testing; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Geometry; Materials testing; Microstrip; Propagation losses; Transmission lines;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/6040.861552
Filename
861552
Link To Document