DocumentCode :
1372174
Title :
Impact properties of PBGA assemblies reflowed in nitrogen ambient and compressed air
Author :
Wu, Y.P. ; Chan, Yan C.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, China
Volume :
23
Issue :
3
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
421
Lastpage :
425
Abstract :
In this paper, the solder joint brittleness of plastic ball grid array (PBGA) assemblies has been studied by means of impact testing. The results show that the maximum impact force and the impact energy for PBGA assemblies reflowed in nitrogen ambient is higher than for those reflowed in compressed air. Reduction of the oxygen content from 1000 ppm to 50 ppm, reduces the initiation energy of impact. The impact fractured surfaces occur between the printed circuit board (PCB) pads and solder joints, i.e., in the brittle intermetallics region. The pores and impurities are mainly distributed within a ring at perimeter of the interface, with greater density at the edges than at the center. Reflow in a nitrogen ambient reduces the defect density, with reduction in oxygen content further reducing the density. Impact cracks begin from the defects of the Cu/solder interface, and propagate along the intermetallics
Keywords :
ball grid arrays; brittleness; impact testing; plastic packaging; reflow soldering; Cu; compressed air; defect density; electronic package; impact testing; impurity distribution; nitrogen ambient; oxygen content; plastic ball grid array; pore distribution; printed circuit board; reflow soldering; solder joint brittleness; Assembly; Electronics packaging; Impurities; Intermetallic; Nitrogen; Plastics; Printed circuits; Soldering; Surface cracks; Testing;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.861556
Filename :
861556
Link To Document :
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