Title :
A fast 3D modeling approach to electrical parameters extraction of bonding wires for RF circuits
Author :
Qi, Xiaoning ; Yue, C. Patrick ; Arnborg, Torkel ; Soh, Hyongsok T. ; Sakai, Hiroyuki ; Yu, Zhiping ; Dutton, Robert W.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
8/1/2000 12:00:00 AM
Abstract :
Bonding wires are extensively used in integrated circuit (IC) packaging and circuit design in RF applications. An approach to fast three-dimensional (3D) modeling of the geometry for bonding wires in RF circuits and packages is demonstrated. The geometry can readily be used to extract electrical parameters such as inductance and capacitance. An equivalent circuit is presented to model the frequency response of bonding wires. To verify simulation accuracy, test structures have been made and measured. Excellent agreement between simulated and measured data is achieved for frequencies up to 10 GHz. The model is well suited for the design and analysis of circuits for cellular phone communication (i.e., order 2 GHz) and future wireless communication (i.e., order 5 GHz)
Keywords :
MMIC; UHF integrated circuits; cellular radio; equivalent circuits; frequency response; integrated circuit modelling; integrated circuit packaging; lead bonding; parameter estimation; 2 to 10 GHz; 3D modeling; 3D modeling approach; IC packaging; bonding wires; cellular phone communication; circuit design; electrical parameters; electrical parameters extraction; equivalent circuit; frequency response; simulation accuracy; test structures; wireless communication; Application specific integrated circuits; Bonding; Circuit simulation; Circuit synthesis; Computational geometry; Integrated circuit packaging; Parameter extraction; Radio frequency; Radiofrequency integrated circuits; Wires;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/6040.861564