• DocumentCode
    1372412
  • Title

    Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

  • Author

    Bruce, S ; Vandamme, L.K.J. ; Rydberg, A.

  • Author_Institution
    Signals & Syst., Uppsala Univ., Sweden
  • Volume
    47
  • Issue
    9
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    1772
  • Lastpage
    1773
  • Abstract
    A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers
  • Keywords
    amplifiers; bipolar transistors; correlation methods; electric noise measurement; semiconductor device measurement; semiconductor device noise; bipolar transistor; correlation measurement; low frequency noise; transimpedance amplifier; voltage amplifier; Bipolar transistors; Circuit noise; Current measurement; Electrical resistance measurement; Low-frequency noise; Low-noise amplifiers; Noise level; Noise measurement; Performance evaluation; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.861592
  • Filename
    861592
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1372412