Title :
A Bayesian Approach for Total Ionizing Dose Hardness Assurance
Author :
Ladbury, R. ; Triggs, B.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We develop a Bayesian RHA methodology for TID. The method is capable of using a broad variety of data for improved qualification and risk mitigation.
Keywords :
hardness; probability; radiation effects; Bayesian RHA methodology; Bayesian approach; risk mitigation; total ionizing dose hardness assurance; Bayesian methods; Degradation; Probability distribution; Radiation effects; Transistors; Probabilistic risk assessment; quality assurance radiation hardness assurance methodology; radiation effects; reliability estimation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2172461
