Title :
Strain Dependence of Superconducting Properties for GdBCO Coated Conductor in High Field Under Tensile Load
Author :
Oguro, H. ; Suzuki, T. ; Minegishi, K. ; Awaji, S. ; Watanabe, K. ; Nishijima, G. ; Sugano, M. ; Machiya, S. ; Shobu, T. ; Sato, M. ; Koganezawa, T. ; Osamura, Kozo ; Ibi, A. ; Yoshizumi, M. ; Izumi, T. ; Shiohara, Y.
Author_Institution :
Inst. for Mater. Res., Tohoku Univ., Sendai, Japan
fDate :
6/1/2012 12:00:00 AM
Abstract :
The strain dependence of Tc and Ic for the GdBCO coated conductor was measured at 77 and 4.2 K in magnetic fields. Tc decreased with increasing applied tensile strain. For the Ic measurements, the magnetic field was applied in the direction parallel to the c-axis (perpendicular to the tape surface). Ic in fields was degraded with increasing strain, and the strain dependence of Ic increased with increasing magnetic field. The ratio of the Ic degradation at 4.2 K was smaller than that at 77 K. These results mean that the Tc degradation is one of the reasons for Ic degradation at 77 K at least. Further, in order to understand the strain effect at 4.2 K, the internal strain of the GdBCO coated conductor under tensile strain was measured using synchrotron radiation. It was found that the strain behavior for the a-axis is different from that for the b-axis. This result suggests that the strain dependence of Ic for GdBCO coated conductors under external tensile strain is related with the Tc degradation behavior of the crystal.
Keywords :
barium compounds; gadolinium compounds; high-temperature superconductors; superconducting critical field; synchrotron radiation; tensile strength; GdBCO coated conductor; GdBa2Cu3O7; magnetic fields; strain dependence; superconducting properties; synchrotron radiation; temperature 4.2 K; temperature 77 K; tensile load; tensile strain; Conductors; Integrated circuits; Strain measurement; Superconducting magnets; Temperature measurement; Tensile strain; GdBCO coated conductor; strain; synchrotron radiation;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2011.2175689