DocumentCode :
137330
Title :
A 1.5nJ/pixel super-resolution enhanced FAST corner detection processor for high accuracy AR
Author :
Seongwook Park ; Gyeonghoon Kim ; Junyoung Park ; Hoi-Jun Yoo
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2014
fDate :
22-26 Sept. 2014
Firstpage :
191
Lastpage :
194
Abstract :
Most vision applications such as object recognition and augmented reality require a high resolution image because their performance is heavily dependent on a local feature point like an edge and a corner. Unfortunately, the vulnerability of correct feature detection always exists in vision applications. Moreover, it is hard to increase image resolution because there is the trade-off between the image resolution and the system power consumption in a wearable device. To resolve this, we present an energy-efficient Features from Accelerated Segment Test (FAST) corner detection processor with a high-throughput super-resolution 4-core cluster for low-power and high accuracy AR applications. To perform high throughput super-resolution, the hardware is proposed with an adaptive multi-issue multiply-accumulate (AMMAC) unit and a shift register (SHR) based angle integrator. Finally, a proposed super-resolution enhanced FAST corner detection processor performs 13.51% detection accuracy enhanced FAST corner detection on up to a 16× super-resolution image with only 1.5nJ/pixel energy efficiency.
Keywords :
augmented reality; computer vision; feature extraction; image resolution; microprocessor chips; object recognition; shift registers; AMMAC unit; FAST corner detection processor; adaptive multiissue multiply-accumulate; angle integrator; augmented reality; energy efficiency; feature detection; features from accelerated segment test; high accuracy AR; high resolution image; high-throughput super-resolution 4-core cluster; object recognition; shift register; system power consumption; vision application; wearable device; Accuracy; Augmented reality; Energy resolution; Feature extraction; Image resolution; Real-time systems; Signal resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Solid State Circuits Conference (ESSCIRC), ESSCIRC 2014 - 40th
Conference_Location :
Venice Lido
ISSN :
1930-8833
Print_ISBN :
978-1-4799-5694-4
Type :
conf
DOI :
10.1109/ESSCIRC.2014.6942054
Filename :
6942054
Link To Document :
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